FOIF
FS1 Parallel Plate Micrometer
The FS1 parallel plate micrometer can be used with other instruments to obtain higher measurement accuracy, such as with the DSZ2 level, it can be used for secondary level measurement and settlement observation. The FS1 parallel plate micrometer can be
Original FOIF unit·Authorized distributor
Overview
About the FS1
The FS1 parallel plate micrometer can be used with other instruments to obtain higher measurement accuracy, such as with the DSZ2 level, it can be used for secondary level measurement and settlement observation. The FS1 parallel plate micrometer can be The FS1 parallel plate micrometer can be used with other instruments to obtain higher measurement accuracy, such as with the DSZ2 level, it can be used for secondary level measurement and settlement observation.
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